Utilizing SWIR-based Camera Platforms for Laser Beam Profiling

The camera-based system is the standard used for laser beam profiles using pulsed light. These cameras are used to track and measure the beam’s width. The applications of such systems are numerous and diverse. Read on to discover the benefits of SWIR camera-based systems for laser beam profiling.

The advantages of silicon-based Optical Systems

Silicon-based charge-coupled devices and silicon-based complementary metal-oxide-semiconductors (e.g. CCDs or CMOS) are frequently employed in high-performance imaging applications . They are capable of detecting wavelengths that range from soft x-rays into near-infrared (NIR). In general the quantum efficiency of CCDs decreases when the detection wavelength increases further into that NIR range. When the wavelength is greater than 1100 nanometers, conventional CCDs and CMOS system light cannot be taken up by a silicon crystal because the photons that are in this kind of light lack enough energy to cause the electron to jump.

The latter model has large area sensors with high resolution, which is essential to get precise measurements of both small and large laser beams. Both types of profilers measure wavelengths from UV through near-infrared (IR). 

SWIR Vision Systems has a proprietary camera line for laser beam profiling with an 800 to 1,700 nm sensor band range that is based on colloidal quantum dots (CQD) thin film photodiodes made monolithically out of quartz wafers for reading. They are able to accomplish for SWIR imaging what CMOS sensors for images, as well as micro-bolometer arrays did for longwave and visible infrared imaging, respectively. CQD laser imaging sensor SWIR are available in camera-based as well as camera-less variants.

Before making a choice on the detector used for the application, one should consider each aspect of the process, including how wavelengths respond.

Choosing an optical system for applied pulsed laser beam measurement

In terms of the application of the technology, there is no single-size-fits-all profiler available, since various lasers have different wavelengths. Additionally, the lasers are equipped with different beam sizes and powers, which means it is necessary to use different optical equipment. The optical systems should include wavelength-specific attenuators as well as antireflective coatings in order to precisely determine the spectrum. These distinctions can lead to errors in measuring processes.

Camera-based systems for profiling laser beams are the most popular choice when it comes to large-scale beam measurements. These systems employ an CMOS-based or photodiode-based sensor to determine the wavelength. In reality, cameras-based systems can be utilized in a variety of applications for industrial settings, the field of research and development and for military purposes.

Camera-based systems for pulsed laser beam profilers provide numerous advantages over devices based on slits. Slit-based systems permit the measurement of extremely small beams directly and camera-based systems are able to detect both unfocused and concentrated beams. They are especially beneficial for factories, where accuracy and repeatability are crucial.

Camera-based systems that use the pulsed beam profiler are incredibly sensitive to artifacts associated with low-linewidth laser beams. The artifacts are removed by careful optical design.

The camera-based system is the ideal choice for a wide range of applications.The cameras that are used for pulsed laser beam profiling are usually C-mount compatible. The camera head has no faceplate on the front of the chip that is used for sensor therefore there’s no need to buy a separate ND filter (the filters filter out all light sources from on the chip).

In contrast to conventional laser beam measurements that require the use of a lens that has a fixed aperture to see a beam, Acuros CDQ Sensors can laser beam profile without cameras. Cameras are not the best choice for large beam applications, as it cannot reliably take beams with smaller dimensions.

Applications

The applications of SWIR Laser Profiling are extremely diverse. These measurements are useful for a variety of processes that include laser collimation as well as characterisation. There are many advantages to making use of CCD beam profilers. CCD beam profiler, such as the ability to measure astigmatism, as well as its ability to translate along the beam path. For example, a CCD beam profiler is able to measure the astigmatism of a laser beam that is essential for measuring the astigmatism of medical images. Additionally the CCD beam profiler can measure astigmatism without a cover glass. Moreover, the absence of cover glass is a key characteristic of beam profilers using CCD. While a CCD camera might not be appropriate for all applications however, it is generally preferred for SWIR laser beam monitoring according to the particular application that is being used.